This paper describes SCORPIO, a new one-dimensional, drift-diffusion s
imulator for modeling silicon-germanium heterojunction bipolar transis
tors (SiGe HBT's) over a wide temperature range (77-400K). SCORPIO wil
l be used to investigate fundamental low-temperature device physics pr
oblems and key device design issues. Comparisons of simulation results
with experimental measurements are being used to ensure accurate mode
l calibration.