ELECTRON-IMPACT DOUBLE-IONIZATION OF SINGLY CHARGED IONS C+, N+, O+, F+ AND NE+

Citation
M. Zambra et al., ELECTRON-IMPACT DOUBLE-IONIZATION OF SINGLY CHARGED IONS C+, N+, O+, F+ AND NE+, Journal of physics. B, Atomic molecular and optical physics, 27(11), 1994, pp. 2383-2397
Citations number
27
Categorie Soggetti
Physics, Atomic, Molecular & Chemical",Optics
ISSN journal
09534075
Volume
27
Issue
11
Year of publication
1994
Pages
2383 - 2397
Database
ISI
SICI code
0953-4075(1994)27:11<2383:EDOSCI>2.0.ZU;2-P
Abstract
The first absolute cross section measurements for double ionization of C+, N+, O+ and Ne+ ions by electron impact are reported. The animated crossed beams method has been employed in the energy range from below ionization thresholds to approximately 2500 eV. The classical binary encounter approximation overestimates measured cross sections by almos t two orders of magnitude. Along the sequence, the cross section maxim um does not follow classical scaling laws. A simple scaling law based on an electron pair ejection model is proposed for the prediction of d irect double ionization. Inner-shell ionization followed by autoioniza tion is seen to play a dominant role for C+ only.