ATOMIC-FORCE MICROSCOPIC STUDY OF RUBBED POLYIMIDE FILMS

Authors
ZHU YM WANG L LU ZH WEI Y CHEN XX TANG JH
Citation
Ym. Zhu et al., ATOMIC-FORCE MICROSCOPIC STUDY OF RUBBED POLYIMIDE FILMS, Applied physics letters, 65(1), 1994, pp. 49-51
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
65
Issue
1
Year of publication
1994
Pages
49 - 51
Database
ISI
SICI code
0003-6951(1994)65:1<49:AMSORP>2.0.ZU;2-N
Abstract
Rubbed polyimide films have been studied by atomic force microscopy fr om micrometer to nanometer scales. On a large scale, oriented scratche s and microstructures due to rubbing have been observed, while on a na nometer scale, oriented polyimide aggregates are visible. The alignmen t of liquid crystals on these films is thus discussed.