Laser pulses of approximately 300 fs duration (300 x 10(-15) s) were a
pplied for second harmonic generation (SHG) at Si electrodes, for the
first time. The frequency doubling by reflection at surfaces of centro
-symmetric materials like Si is generated only at the surface due to t
he breaking of the crystal symmetry. This method is particularly inter
esting because even buried solid state interfaces can be studied. SHG
as a non-linear optical effect needs high illumination power densities
. This has restricted its use mainly to metal electrodes. Our recent s
tudies with ns laser pulses showed that even semiconductor electrodes
can be probed with SHG if the duration of the light pulses is shorter
than any electron transfer reaction. A further advantage of fs pulses
is the fact that illumination fluences well below the damage threshold
, but still with sufficient power density, can be chosen. In contrast,
the use of ns pulses required an operation near the damage threshold.
Si electrodes in contact with aqueous electrolytes are normally cover
ed by an oxide layer of SiO2 with a transition layer of non-stoichiome
tric suboxide SiO(x) (1 < x < 2). The extension of this layer as well
as its growth mechanism and structure are still under discussion. Surf
ace SHG promises to provide direct insight into this buried interface
since the SH signal is generated exactly there. An oxide covered Si(11
1) surface yields an azimuthal SHG dependence as expected from the (11
1)C3nu symmetry. Removal of the oxide causes a drop in SH intensity wi
th a subsequent rise ascribable to changes of the static electric fiel
d in the transition layer. At an oxide covered Si(111) electrode the S
H signal can be modulated by an externally applied potential.