FRICTIONAL AND ATOMIC-SCALE STUDY OF C-60 THIN-FILMS BY SCANNING FORCE MICROSCOPY

Authors
LUTHI R HAEFKE H MEYER E HOWALD L LANG HP GERTH G GUNTHERODT HJ
Citation
R. Luthi et al., FRICTIONAL AND ATOMIC-SCALE STUDY OF C-60 THIN-FILMS BY SCANNING FORCE MICROSCOPY, Zeitschrift fur Physik. B, Condensed matter, 95(1), 1994, pp. 1-3
Citations number
11
Categorie Soggetti
Physics, Condensed Matter
Journal title
Zeitschrift fur Physik. B, Condensed matter → ACNP
ISSN journal
07223277
Volume
95
Issue
1
Year of publication
1994
Pages
1 - 3
Database
ISI
SICI code
0722-3277(1994)95:1<1:FAASOC>2.0.ZU;2-B
Abstract
Scanning force microscopy (SFM) was employed to characterize C60 islan d films in an ultra-high vacuum (UHV). The initial growth stage of C60 on NaCl cleavage faces and nanotribological properties of this solid lubricant are investigated. In comparison to the NaCl(001) face, highe r friction is measured on the C60 islands, resulting in a ratio of fri ction of 1:3 for NaCl:C60. The friction coefficient of the (111) orien ted C60 island is determined to be 0.15+/-0.05. High-resolution SFM im ages reveal the hexagonal lattice of the unreconstructed (111) top sur faces and the overgrowth relationships of the C60 islands.