The dynamics of pore formation in silicon was studied by computer simu
lation. Porous structures were generated by a Monte Carlo algorithm th
at controlled the motion of an ensemble of electronic holes on a two-d
imensional square lattice. Hole motion was biased to the nearest pore
tip in order to simulate local electric-field effects corresponding to
the depletion layer setup in n-type silicon. Several morphological ch
aracteristics seen in porous silicon were seen in the simulation: high
ly directional pores, steady-state pore spacing, and a smooth pore fro
nt. The pore spacing and the degree of sidebranching depended on the c
oncentration of holes and the magnitude of the bias. The simulation tr
ends are analogous to the pore morphologies seen in n-type silicon.