MICROSTRUCTURE OF CO-NI AU MULTILAYERS STUDIED BY XRD/

Several series of Co-Ni/Au multilayers were investigated using differe nt X-ray diffraction methods. The compositions and thicknesses of the Co-Ni layers were varied, and the influence of temperature treatment o f gold buffer on the quality of the multilayers was studied. According to the results, the quality of the multilayers is influenced primaril y by the roughness of the substrate and the buffer. The Co-Ni/Au multi layer systems grow predominantly with a replicative, highly correlated roughness induced by the substrate and buffer roughness. A cumulative roughness was found only rarely. In contrast, a decrease in the origi nal roughness towards the sample surface was found for certain deposit ion parameters.