F. Katsuki et al., SURFACE-MORPHOLOGY OBSERVATION OF SILICON STEEL SHEETS BY SCANNING TUNNELING MICROSCOPE, Nippon Kinzoku Gakkaishi, 58(6), 1994, pp. 668-674
Scanning tunneling microscope (STM) has been applied to the investigat
ion of surface morphology of silicon steel sheets. A polished specimen
was annealed in a vacuUM of 10(-4) Pa at 1300-degrees-C for 10 min. T
he detailed observations reveal that fine facet structure is formed ne
ar (001) of the alpha-Fe grains, and that the terrace width and the st
ep height of the facet are determined by the misorientation angle of t
he grains from the [001] orientation. These results and the observed m
inimum step height of 0.5 nm of the terrace suggest that the (001) sur
face of the silicon steel sheets can be covered with a this iron oxide
film with possible orientation relationship of alpha-Fe(001)//FeO(001
) or alpha-Fe(001)//Fe3O4(001) and alpha-Fe[100]//FeO[110] or alpha-Fe
[100]//Fe3O4[110]. The change of facet structures due to lowering anne
aling temperature are also discussed.