MOBILE POINT-DEFECTS AND ATOMIC BASIS FOR STRUCTURAL TRANSFORMATIONS OF A CRYSTAL-SURFACE

Citation
Is. Hwang et al., MOBILE POINT-DEFECTS AND ATOMIC BASIS FOR STRUCTURAL TRANSFORMATIONS OF A CRYSTAL-SURFACE, Science, 265(5171), 1994, pp. 490-496
Citations number
25
Categorie Soggetti
Multidisciplinary Sciences
Journal title
ISSN journal
00368075
Volume
265
Issue
5171
Year of publication
1994
Pages
490 - 496
Database
ISI
SICI code
0036-8075(1994)265:5171<490:MPAABF>2.0.ZU;2-O
Abstract
Structural transformations on elemental semiconductor surfaces typical ly occur above several hundred degrees Celsius, and the atomic motions involved are extremely rapid and difficult to observe. However, on th e (111) surface of germanium, a few lead atoms catalyze atomic motions so that they can be observed with a tunneling microscope at temperatu res below 80 degrees C. Mass transport and structural changes are caus ed by the creation and propagation of both vacancy-like and interstiti al-like point defects within the crystal surface. The availability of dangling bonds on the surface is critical. A detailed atomic model for the observed motions has been developed and is used to explain the st ructural phase transition Ge(111)-c(2x8) <----> 1 x 1, which occurs ne ar 300 degrees C.