Ass. Alkabbani et al., GAMMA-RADIATION EFFECTS OF LIGHT-EMITTING AND VARIABLE CAPACITANCE DEVICES, Arabian journal for science and engineering, 19(2A), 1994, pp. 163-173
Gamma radiation doses as low as a few krads caused significant increas
es in the output of light-emitting diodes (LEDs). Further irradiation,
above 10 krad, produced permanent radiation damage associated with th
e degradation of light emitted and the output electrical characteristi
cs. Capacitance-voltage and current-voltage measurements have shown th
at LED devices are sensitive to the gamma-ray dose. Such behavior sugg
ests that LED devices can be successfully employed for the determinati
on of absorbed dose in the relatively low gamma dose range. Following
irradiation, shelf annealing of the damaged cells, at room temperature
for 200 days, leads to recovery of 17-18% of their initial output lig
ht intensity. Oven annealing at different temperatures ranging up to 5
00-degrees-C, for 50 minutes, shows that the output light intensity le
vels recover to around 22%, 25%, 33%, 43%, and 67.5% of the initial va
lues under the influence of annealing temperature levels of 100-degree
s-C, 200-degrees-C, 400-degrees-C, and 500-degrees-C respectively. Var
actor type ''BA102'' offered a high resistance to gamma exposure. The
response of its (C-V) and (I-V) relationships to radiation started onl
y in the Mrad range, where the change is found to occur over a relativ
ely wide radiation dose range (up to 130 Mrads). The ratio of capacita
nce variation (C/C(o)) due to gamma irradiation is increased from 2.7,
at zero dose, to 4.5 after exposure to 50 Mrads and at a reverse bias
of 10 volts.