Surface plasmon enhancement of laser ablation of thin Al films is exam
ined with a view to its application in metal film patterning and nano-
structuring. Al films, deposited on silica prisms, are first character
ized by attenuated total reflection using a broadband UV source and ap
propriate interference filter. The films are subsequently subjected to
excimer laser radiation of wavelength 248 nm under conditions both of
direct incidence from the air side of the film, and of surface plasmo
n excitation in which light is incident through the prism at greater t
han critical angle. For a given level of ablation damage in a particul
ar film the fluence required using the surface plasmon technique is 3-
5 times less than that needed when direct incidence is used. This is r
oughly in line with the energy absorbed in the film. From a practical
standpoint it is clear that ablation of metal films can be achieved wi
th much lower fluences than has hitherto been possible, thus reducing
the requirements on laser output and relaxing the power handling const
raints on any input optical elements.