ELECTRON-MOBILITY ENHANCEMENT IN SI USING DOUBLY DELTA-DOPED LAYERS

Citation
Hh. Radamson et al., ELECTRON-MOBILITY ENHANCEMENT IN SI USING DOUBLY DELTA-DOPED LAYERS, Applied physics letters, 64(14), 1994, pp. 1842-1844
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
64
Issue
14
Year of publication
1994
Pages
1842 - 1844
Database
ISI
SICI code
0003-6951(1994)64:14<1842:EEISUD>2.0.ZU;2-8
Abstract
Large enhancements in the electron mobility are reported for structure s containing a pair of closely spaced Sb delta-doped layers in Si. The room-temperature mobility is enhanced by a factor of 2 compared to co rresponding uniformly doped layers of singly delta-doped structures. E ven higher mobilities were obtained by using a Schottky gate on top an d applying a voltage to adjust the potential well. With an effective g ate voltage of approximately -0.3 V the mobility was 1200 cm2 V-1 s-1 at room temperature, which is an enhancement by a factor of 10 relativ e to the layer with equivalent bulk doping concentration. The high mob ility is attributed to wave functions with nodes at the delta-doped la yers.