A DUAL-SCAN PIEZO ELEMENT FOR SCANNING PROBE MICROSCOPES

Authors
PORTER TL
Citation
Tl. Porter, A DUAL-SCAN PIEZO ELEMENT FOR SCANNING PROBE MICROSCOPES, Review of scientific instruments, 65(7), 1994, pp. 2416-2416
Citations number
1
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
65
Issue
7
Year of publication
1994
Pages
2416 - 2416
Database
ISI
SICI code
0034-6748(1994)65:7<2416:ADPEFS>2.0.ZU;2-9
Abstract
A simple method of achieving dual scan ranges with a single piezo elem ent in scanning probe microscope instruments is described. Both high-r esolution small-scan ranges and low-resolution large-scan areas are ob tainable.