F. Docchio et al., A COMBINED DISTANCE AND SURFACE PROFILE MEASUREMENT SYSTEM FOR INDUSTRIAL APPLICATIONS - A EUROPEAN PROJECT, Measurement science & technology, 5(7), 1994, pp. 807-815
The paper reports the design, development and characterization of an e
lectrooptical equipment suitable for distance measurements and three-d
imensional gauging of surfaces of industrial interest. The equipment c
omprises a dual-wavelength heterodyne interferometer for absolute dist
ance measurements with a range of 20 m and an accuracy of 0.1 mm, that
is integrated with a macroscopic scale, adaptive profilometer for thr
ee-dimensional measurement of the shape to 1 mm. The performance of th
e equipment is well suited for effective operation in industrial metro
logy. The equipment has been developed by three partners, namely the D
ipartimento di Elettronica per l'Automazione of the University of Bres
cia, the Sezione Diagnostica Elettroottica of CISE, Milan, and the Ins
titut fur technische Optik of the University of Stuttgart, in the fram
ework of a European Project partially funded by the Community Bureau o
f Reference.