An interferometric technique for photoelastic testing of small and tra
nsparent samples is proposed. By the introduction of two properly orie
nted polarisers in the two arms of a Twyman-Green interferometer, it h
as been shown that the modified interferometer is rendered sensitive t
o birefringent samples placed in the path of a plane polarised paralle
l beam of light entering the interferometer. Since the sample is place
d in the common arm, unequal phases either inherent in the sample or d
ue to deformation under stress will not be reflected in the output. Du
ring the testing procedure, the two arms of the interferometer can be
left totally undisturbed. Information on the stress distribution over
the sample area can be obtained from the recorded interferometric patt
ern - since the recorded fringe shifts are proportional to the develop
ed stresses. The principle of the technique is discussed and experimen
tal results are provided.