A NEW, OPTICAL-LEVER BASED ATOMIC-FORCE MICROSCOPE

Authors
HANSMA PK DRAKE B GRIGG D PRATER CB YASHAR F GURLEY G ELING SV FEINSTEIN S LAL R
Citation
Pk. Hansma et al., A NEW, OPTICAL-LEVER BASED ATOMIC-FORCE MICROSCOPE, Journal of applied physics, 76(2), 1994, pp. 796-799
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
76
Issue
2
Year of publication
1994
Pages
796 - 799
Database
ISI
SICI code
0021-8979(1994)76:2<796:ANOBAM>2.0.ZU;2-0
Abstract
A new optical-lever based atomic force microscope is described in whic h the cantilever scans and is accurately tracked by a scanning focused spot. It can operate at forces below one nanoNewton over image areas greater than 100 mu X 100 mu. It can be combined with optical microsco pes of high numerical aperture and operated with the sample and cantil ever in fluids. As examples of its applications, images of living cell s in Petri dishes and a 6 in. (15.24 mm) silicon wafer are included.