Ca. Parsons et al., PSEUDOMORPHIC HIGH-ELECTRON-MOBILITY TRANSISTOR CHANNEL SHEET CHARGE MEASURED BY PHOTOLUMINESCENCE, Journal of applied physics, 76(2), 1994, pp. 1343-1345
Nondestructive room temperature photoluminescence of the InGaAs channe
l of a pseudomorphic high electron mobility transistor is presented as
a function of bias applied to a semitransparent gate. The channel ele
ctron sheet concentration is evaluated via line-shape fitting of the p
hotoluminescence spectrum. Excellent agreement with electrically deriv
ed values of the channel charge was found. Information on the symmetry
of the channel potential is also provided by the results of the photo
luminescence line-shape fit.