The utility and robustness of wavelet features is demonstrated through
three practical case studies of detecting objects in multispectral el
ectro-optical imagery, sidescan sonar imagery, and acoustic backscatte
r. Attention is given to choosing proper waveforms for particular appl
ications. Using artificial neural networks (ANNs), evidence is fused f
rom multiple-waveform types that detect local features. The wavelet wa
veforms and their dilation and shift parameters are adaptively compute
d with ANNs to maximize classification accuracy. Emphasis is placed on
the acoustic backscatter case study, involving detecting a metallic m
an-made object from natural and synthetic specular clutter with reverb
eration noise. The synthetic clutter is shown to be a good model for t
he natural clutter, which appears promising for avoiding huge data col
lection efforts for natural clutter and for better delineating the cla
ssification boundary. The classifier computes the locations, sizes, an
d weights of Gaussian patches in time-scale space that contain the mos
t discriminatory information. This new approach is shown to give highe
r classification rates than an ANN with commonly used power spectral f
eatures. The new approach also reduces the number of free parameters i
n the classifier based on all wavelet features, which leads to simpler
implementation for applications and to potentially better generalizat
ion to test data.