STRUCTURAL AND ELECTRONIC STUDIES OF C-60 FILMS DEPOSITED USING IONIZED CLUSTER BEAM DEPOSITION

Films of a new form of carbon allotrope, C60, also known as fullerenes , are deposited on Si(111) substrates by the ionized cluster beam depo sition technique under an accelerating field less than 100 V. Raman sp ectra and x-ray photoelectron spectroscopy measurements are carried ou t to analyse the electronic properties of the films, to indicate the e xistence of C60 soccer-balls in the films. The resistance of this C60 film deposited here to oxygen contamination is better than that deposi ted by molecular beam epitaxy. Binding energies of C Is peaks for C60 and highly oriented pyrolytic graphite are 284.7 and 284.3 eV, respect ively. X-ray theta-2theta diffraction investigations show that C60 fil ms deposited under V(a) = 0 V have highly textured close-packed struct ure with x-ray diffraction assignment (110), while those deposited und er V(a) = 65 V turn out to be more polycrystalline. C60 soccer-balls a re found to be broken into fragments as accelerating field exceeds abo ut 400 V, indicated by the results of x-ray photoelectron spectroscopy , Raman spectra, x-ray diffraction, and ultraviolet visible absorption spectra.