Mn. Makadsi et al., DEPENDENCE OF ELECTRICAL-CONDUCTIVITY AND BANDGAP OF THE GRADED SYSTEM CDTE1-XSX ON THE STRUCTURE AND ANNEALING TREATMENT, International journal of electronics, 76(5), 1994, pp. 857-864
Graded thin films of the system Cd Te1-xSx were prepared by evaporatio
n from two sources and their structures, energy gaps and electrical co
nductivity were studied as functions of annealing temperature. X-ray d
iffraction and optical analysis showed a mixture of cubic and hexagona
l structures. Further, the spectroscopic examination showed that the b
andgap of the graded thin film covered all the energy gap values in th
e range from about 1.45 eV for Cd Te to about 2.45 eV for Cd S. Electr
ical conductivity measurements were made and discussed. Samples doped
within the range 1-2% In were n-type and the doping reduced the values
of energy gap and also the conductivity.