Mn. Khan et al., STRUCTURAL, ELECTRICAL AND SPECTROSCOPIC STUDIES OF THE SYSTEM NI1-XCUUXFE2O4, International journal of electronics, 76(5), 1994, pp. 953-959
Data are presented on the d.c. conductivity, x-ray analysis and infra-
red spectroscopy of the system Ni1-xCuxFe2O4, particularly as a functi
on of the copper content. Electrical conductivity measurements reveale
d that the activation energy for conductivity decreases with increasin
g copper content. The mobility of holes calculated from infra-red meas
urements corresponds to the values from the conductivity data. From x-
ray diffraction analysis and electrical conductivity measurements, it
may be concluded that in the system Ni1-xCuxFe2O4, Ni2+ and Fe2+ are f
ound at octahedral sites and Cu2+ at tetrahedral sites. Comparison of
these measurements is made with the data obtained on the Zn1-xCuxAl2O4
system.