STACKING DEFECTS IN C-60 FILMS

The structure of pollycrystalline C60 films prepared by sublimation fr om 99.9% pure C60 powder and from graphite soot was investigated by X- ray diffraction. A complex fcc (111) line was found in the former samp les. Comparison of experimental and simulated (111) profiles allowed t o assess quantitatively the degree of stacking disorder introduced dur ing the growth of the film. Probabilities could be derived for continu ation of already started fcc and hcp sequences, thereby characterizing the statistical microstructure of the C60 films. Also, the relative m agnitudes of inter- and intra-layer disorder can be estimated. The fil ms deposited from graphite soot show a high structural disorder.