X-RAY DIFFUSE-SCATTERING FROM LEAD STEARATE MULTILAYERS

We give an account of X-ray diffuse scattering (XDS) as a non-destruct ive technique to characterize the defect structure of organic multilay ers. As well as the interface roughness we especially investigated the lateral correlation length tau of scattering aggregates using the ang le-dispersive as well as the energy-dispersive scattering from a Pb st earate film. Although the present theoretical model is not satisfactor y, it is possible to relate tau to the in-plane dimension of the micro crystalline domains. The XDS and the X-ray specular reflectivity (XSR) depend in a different manner on the interface roughness and the domai n size. Therefore the ratio of XDS and XSR measured at special points of reciprocal space can be used to observe the changes in these real s tructure parameters. This is demonstrated in the case of thermally ind uced melting of domains.