STOCHASTIC ENDOR

Electron-nuclear double-resonance CW experiments often suffer from sma ll signal intensities and other experimental problems because of the l ong nuclear relaxation times involved. This is particularly true for d efects in semiconductors. Considerable progress in terms of noise immu nity and sensitivity enhancement is possible by the introduction of a new ENDOR measurement technique termed stochastic ENDOR. In this type of experiment, periodic signals are no longer detected, but single eve nts are measured at arbitrarily chosen radiofrequency values inducing NMR transitions. The measurement technique is explained and first resu lts are presented demonstrating the potential of this method. (C) 1994 Academic Press, Inc.