Tw. Horst et Jc. Weil, HOW FAR IS FAR ENOUGH - THE FETCH REQUIREMENTS FOR MICROMETEOROLOGICAL MEASUREMENT OF SURFACE FLUXES, Journal of atmospheric and oceanic technology, 11(4), 1994, pp. 1018-1025
Recent model estimates of the flux footprint are used to examine the f
etch requirements for accurate micro-meteorological measurement of sur
face fluxes of passive, conservative scalars within the surface flux l
ayer. The required fetch is quantified by specifying an acceptable rat
io of the measured flux to the local surface flux. When normalized by
the measurement height z(m), the fetch is found to be a strong functio
n of atmospheric stability as quantified by z(m)/L, where L is the Obu
khov length, and a weaker function of the normalized measurement heigh
t z(m)/z0, where z0 is the roughness length. Stable conditions are fou
nd to require a much greater fetch than do unstable conditions, and th
e fetch required for even moderately stable conditions is for many sit
uations considerably greater than 100 times the measurement height.