J. Schweppe et al., ACCURATE MEASUREMENT OF MG AND AL K-ALPHA-1,2 X-RAY-ENERGY PROFILES, Journal of electron spectroscopy and related phenomena, 67(3), 1994, pp. 463-478
We have obtained new, accurate, high-resolution measurements of the en
ergy distribution of Kalpha1,2 X-rays emitted in fluorescence from Mg
and from Al. The energy profiles were obtained by measuring their Brag
g diffraction with a double flat-crystal spectrometer equipped with ac
curate angle encoders. Both potassium dihydrogen phosphate and ammoniu
m dihydrogen phosphate crystals were used to check the index-of-refrac
tion correction to Bragg diffraction, the largest source of uncertainl
y in this measurement. Through the use of Cu Kalpha1 as a transfer sta
ndard, these X-ray energies (or wavelengths) have been connected with
the optical wavelength scale, and thus to the Rydberg constant R(infin
ity). Separate Kalpha1 and Kalpha2 energies as well as the centroids a
nd maxima of the Kalpha1,2 distributions are given for both Mg and Al:
separate Kalpha1 and Kalpha2 energies for Mg are presented here for t
he first time. Resulting uncertainty estimates are in the range 0.01 -
0.015eV.