ACCURATE MEASUREMENT OF MG AND AL K-ALPHA-1,2 X-RAY-ENERGY PROFILES

Citation
J. Schweppe et al., ACCURATE MEASUREMENT OF MG AND AL K-ALPHA-1,2 X-RAY-ENERGY PROFILES, Journal of electron spectroscopy and related phenomena, 67(3), 1994, pp. 463-478
Citations number
66
Categorie Soggetti
Spectroscopy
ISSN journal
03682048
Volume
67
Issue
3
Year of publication
1994
Pages
463 - 478
Database
ISI
SICI code
0368-2048(1994)67:3<463:AMOMAA>2.0.ZU;2-P
Abstract
We have obtained new, accurate, high-resolution measurements of the en ergy distribution of Kalpha1,2 X-rays emitted in fluorescence from Mg and from Al. The energy profiles were obtained by measuring their Brag g diffraction with a double flat-crystal spectrometer equipped with ac curate angle encoders. Both potassium dihydrogen phosphate and ammoniu m dihydrogen phosphate crystals were used to check the index-of-refrac tion correction to Bragg diffraction, the largest source of uncertainl y in this measurement. Through the use of Cu Kalpha1 as a transfer sta ndard, these X-ray energies (or wavelengths) have been connected with the optical wavelength scale, and thus to the Rydberg constant R(infin ity). Separate Kalpha1 and Kalpha2 energies as well as the centroids a nd maxima of the Kalpha1,2 distributions are given for both Mg and Al: separate Kalpha1 and Kalpha2 energies for Mg are presented here for t he first time. Resulting uncertainty estimates are in the range 0.01 - 0.015eV.