GAIN MEASUREMENT OF SEMICONDUCTOR-LASER DIODES - REQUIREMENTS FOR THEWAVELENGTH RESOLUTION AND SENSITIVITY TO NOISE

Authors
JORDAN V
Citation
V. Jordan, GAIN MEASUREMENT OF SEMICONDUCTOR-LASER DIODES - REQUIREMENTS FOR THEWAVELENGTH RESOLUTION AND SENSITIVITY TO NOISE, IEE proceedings. Optoelectronics, 141(1), 1994, pp. 13-15
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic",Optics,Telecommunications
Journal title
IEE proceedings. Optoelectronics → ACNP
ISSN journal
13502433
Volume
141
Issue
1
Year of publication
1994
Pages
13 - 15
Database
ISI
SICI code
1350-2433(1994)141:1<13:GMOSD->2.0.ZU;2-F
Abstract
The gain-measurement methods of Hakki-Paoli and Cassidy are investigat ed theoretically with respect to accuracy of gain evaluation and sensi tivity to noise. The Cassidy method proves to be less sensitive to noi se than the Hakki-Paoli method if an additional averaging procedure is introduced. The results presented permit easy establishment of the re quired performance of an appropriate measurement system.