M. Angadi et V. Thanigaimani, YOUNG MODULUS OF MNAL AND MNBI FILMS, Materials science & engineering. B, Solid-state materials for advanced technology, 25(2-3), 1994, pp. 120000007-120000008
The dependence on thickness of Young's modulus of vacuum evaporated Mn
Al and MnBi films is reported for thicknesses in the range 30-120 nm.
A vibrating reed method is uded to determine Young's modulus of films.