One of the many calibrations performed for a scientific-quality spectr
ometer is the characterization of its scattered-light properties. The
scattered light can arise from any optical surface, and light leaks or
scattering from baffles can also contribute to the instrumental stray
-light level. For a diffraction-grating spectrometer the primary contr
ibution to instrumental scattered light has been found to be the scatt
ered light from the grating. The results from measuring the scattered-
light properties of 10 diffraction gratings are discussed along with t
he application of these results in analyzing the total scattered light
measured for three spectrometers. It has been found from these measur
ements that there are two components of the grating scattered light: a
Lorentzian-type component and a constant background component. The Lo
rentzian component is predicted from the diffraction theory for a grat
ing, and the constant background component is consistent with Rayleigh
scattering from the microscopic surface imperfections. It was also di
scovered that multiple replicas of gratings from the same master grati
ng exhibit significantly more scattered light than the preceding repli
ca by factors of 1.1-2.