Nd. Jankovic et E. Bushehri, THEORETICAL AND EXPERIMENTAL EVALUATION OF HIGH-VOLTAGE CMOS INVERTERS, IEE proceedings. Circuits, devices and systems, 141(3), 1994, pp. 162-166
A high-voltage CMOS technology featuring a 45 V maximum blocking volta
ge is described. The transistor output characteristics at high voltage
s are simulated by employing an impact-ionisation current model and th
e results are verified by measurements on fabricated test structures.
Proper inverter operation is maintained up to a supply voltage of 35 V
, despite a large impact-ionisation-induced mismatch in the pMOS and n
MOS output characteristics at high voltages. In addition, simulation r
esults reveal that impact-ionisation currents have little effect on in
verter performance in terms of power dissipation. The inverter delay t
imes are also found to be independent of the transistor sizes for supp
ly voltages of above 25 V; therefore, small-geometry transistors can b
e used to reduce the overall area of the high-voltage circuits.