HIGH-FREQUENCY AND HIGH-RESOLUTION CAPACITANCE MEASURING CIRCUIT FOR PROCESS TOMOGRAPHY

Citation
Wq. Yang et al., HIGH-FREQUENCY AND HIGH-RESOLUTION CAPACITANCE MEASURING CIRCUIT FOR PROCESS TOMOGRAPHY, IEE proceedings. Circuits, devices and systems, 141(3), 1994, pp. 215-219
Citations number
10
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
13502409
Volume
141
Issue
3
Year of publication
1994
Pages
215 - 219
Database
ISI
SICI code
1350-2409(1994)141:3<215:HAHCMC>2.0.ZU;2-#
Abstract
A stray-immune AC capacitance measuring circuit has been developed for electrical capacitance tomography. For this application a high excita tion frequency is essential to achieve high sensitivity and fast data collection rates, and also to reduce the effect of any conductive comp onent in parallel with the measured capacitance. A high excitation fre quency has been made possible by using some novel methods: (a) a high frequency digital signal generator; (b) parameter-optimised AC amplifi ers and (c) a phase-sensitive demodulator utilising CMOS switches. Wit h a 500 kHz excitation signal the circuit has good linearity and stabi lity, and a resolution of 0.035 fF.