Wq. Yang et al., HIGH-FREQUENCY AND HIGH-RESOLUTION CAPACITANCE MEASURING CIRCUIT FOR PROCESS TOMOGRAPHY, IEE proceedings. Circuits, devices and systems, 141(3), 1994, pp. 215-219
A stray-immune AC capacitance measuring circuit has been developed for
electrical capacitance tomography. For this application a high excita
tion frequency is essential to achieve high sensitivity and fast data
collection rates, and also to reduce the effect of any conductive comp
onent in parallel with the measured capacitance. A high excitation fre
quency has been made possible by using some novel methods: (a) a high
frequency digital signal generator; (b) parameter-optimised AC amplifi
ers and (c) a phase-sensitive demodulator utilising CMOS switches. Wit
h a 500 kHz excitation signal the circuit has good linearity and stabi
lity, and a resolution of 0.035 fF.