X-RAY K-ABSORPTION STUDIES OF SOME SCHIFF-BASE COPPER-COMPLEXES

The chemical shifts and widths of copper K-edges are reported for some schiff base copper complexes by means of X-ray absorption spectroscop y in which a Cauchris type bend spectrograph has been utilized. The me tal-ligand distances have been computed using Levy's method. The resul ts arc examined to understand the nature of metal-ligand bonding. The observed linear relationships between chemical shifts (E, eV) and bond distance/(angstrom) and edge width and metal-ligand electronegative d ifferences have been interpreted in terms of changes in the degree of covalency of the metal-ligand bonding in the synthesised copper comple xes.