The stress-strain curves of InSb[123] have been investigated in the te
mperature range extending from 340 to 510-degrees-C. The two stages of
dynamical recovery typical for elemental and compound semiconductors
are observed in this material. The underlying micromechanical processe
s are identified as diffusion-controlled climb and cross-slip respecti
vely. There is no indication of a further regime of dynamical recovery
, in contrast with the behaviour of Ge and Si with [123] orientation.