Various effects of the electric field on YBa2Cu3O7-delta grain boundar
y Josephson junctions were studied using inverted metal-insulator-supe
rconductor (MIS) samples which employed bicrystal SrTiO3 substrates as
insulators. The critical currents, I(c) of the junctions were regulat
ed by gate voltages with the field-induced changes in charge carrier d
ensities. Furthermore, a significant field eff ect on equidistant step
structures observed in I-V curves was found. The equidistant steps ca
n be ascribed to self-resonances of the ac Josephson current in the gr
ain boundary junctions. The gate voltages shifted the step voltages co
rresponding to resonance frequencies of the grain boundary toward high
voltages. This appears to be a consequence of the field dependence of
dielectric properties of grain boundary junctions.