IV CHARACTERISTICS OF 1D-0D-1D DOUBLE-BARRIER STRUCTURES AND PERSISTENCE OF FINE-STRUCTURE AT HIGH-TEMPERATURES

Authors
Citation
M. Boero et Jc. Inkson, IV CHARACTERISTICS OF 1D-0D-1D DOUBLE-BARRIER STRUCTURES AND PERSISTENCE OF FINE-STRUCTURE AT HIGH-TEMPERATURES, Physical review. B, Condensed matter, 50(4), 1994, pp. 2479-2484
Citations number
17
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
50
Issue
4
Year of publication
1994
Pages
2479 - 2484
Database
ISI
SICI code
0163-1829(1994)50:4<2479:ICO1DS>2.0.ZU;2-5
Abstract
A theoretical investigation of coupled quantum-wire-quantum-dot-quantu m-wire resonant-tunneling diodes is presented, with particular emphasi s on the basic mechanisms producing the fine structure in the current- voltage characteristics. The possibility of having two different types of fine structure is remarked upon, and an explanation is proposed fo r the relative lack of thermal smearing observed in certain devices th at could be important for the use of low-dimensional devices at high t emperatures. The I-V curves are calculated numerically for two typical structures and very good agreement with experiments is obtained.