Dm. Schaefer et al., SURFACE FORCE INTERACTIONS BETWEEN MICROMETER-SIZE POLYSTYRENE SPHERES AND SILICON SUBSTRATES USING ATOMIC-FORCE TECHNIQUES, Journal of adhesion science and technology, 8(3), 1994, pp. 197-210
The surface force interactions between a single micrometer-size polyst
yrene sphere and a p-type silicon substrate were investigated using at
omic force microscope techniques. The force of removal and the degree
of deformation of the particle determined as a function of the applied
loading force. The work of removal, estimated assuming a perfectly sp
herical particle and a smooth substrate, was also determined. The infl
uence of surface contamination and the implications of the short conta
ct times used in these experiments are discussed.