SURFACE FORCE INTERACTIONS BETWEEN MICROMETER-SIZE POLYSTYRENE SPHERES AND SILICON SUBSTRATES USING ATOMIC-FORCE TECHNIQUES

The surface force interactions between a single micrometer-size polyst yrene sphere and a p-type silicon substrate were investigated using at omic force microscope techniques. The force of removal and the degree of deformation of the particle determined as a function of the applied loading force. The work of removal, estimated assuming a perfectly sp herical particle and a smooth substrate, was also determined. The infl uence of surface contamination and the implications of the short conta ct times used in these experiments are discussed.