SURFACE FORCE INTERACTIONS BETWEEN MICROMETER-SIZE POLYSTYRENE SPHERES AND SILICON SUBSTRATES USING ATOMIC-FORCE TECHNIQUES

Citation
Dm. Schaefer et al., SURFACE FORCE INTERACTIONS BETWEEN MICROMETER-SIZE POLYSTYRENE SPHERES AND SILICON SUBSTRATES USING ATOMIC-FORCE TECHNIQUES, Journal of adhesion science and technology, 8(3), 1994, pp. 197-210
Citations number
42
Categorie Soggetti
Engineering, Chemical","Material Science",Mechanics
ISSN journal
01694243
Volume
8
Issue
3
Year of publication
1994
Pages
197 - 210
Database
ISI
SICI code
0169-4243(1994)8:3<197:SFIBMP>2.0.ZU;2-2
Abstract
The surface force interactions between a single micrometer-size polyst yrene sphere and a p-type silicon substrate were investigated using at omic force microscope techniques. The force of removal and the degree of deformation of the particle determined as a function of the applied loading force. The work of removal, estimated assuming a perfectly sp herical particle and a smooth substrate, was also determined. The infl uence of surface contamination and the implications of the short conta ct times used in these experiments are discussed.