GROWTH OF THIN AG2S FILMS ON SILVER LAYERS - IN-SITU ELLIPSOMETRIC AND CONDUCTIVITY STUDIES

The growth of thin Ag2S films on silver layers from diluted H2S gas ha s been studied by means of in situ ellipsometric and DC conductivity m easurements. The experimental data from the ellipsometric studies were explained by means of a model consisting of silver and Ag2S films and a thin layer of H2O of variable thickness on top of them. The variati on in the conductivity of the silver layer could be explained on the b asis of the decreasing thickness of the silver layer when a thin Ag2S film grew on it, together with the increasing reflection of the curren t carriers from the grain boundaries.