INDUCED CRITICAL-CURRENT DENSITY LIMIT OF AG SHEATHED BI-2223 TAPE CONDUCTOR

Citation
H. Ogiwara et al., INDUCED CRITICAL-CURRENT DENSITY LIMIT OF AG SHEATHED BI-2223 TAPE CONDUCTOR, IEEE transactions on magnetics, 30(4), 1994, pp. 2399-2401
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
30
Issue
4
Year of publication
1994
Part
2
Pages
2399 - 2401
Database
ISI
SICI code
0018-9464(1994)30:4<2399:ICDLOA>2.0.ZU;2-M
Abstract
We have already reported the best critical current density of 66,000 A /cm2 with an Ag sheathed Bi-2223 tape conductor. The Brick-wall model is for explaining the current transport mechanism of this conductor. T he model has its roots in the fact that the Bi-2223 tape com is a comp licated stack of crystals which have a mica-flake structure. The orien tation of the crystals seriously affects the current transport capabil ity. Moreover, the contacts between the stacking crystals are very imp ortant. The transport current flows dividing into many branch paths. U nder high magnetic field, the different paths experienced different el ectromagnetic forces. Differences between the electromagnetic forces o n the different crystals can affect the contacts so as to increase res istivity and decrease overall critical current density of the tape. Th is effect can foretell the limit of the critical current density obtai nable with these kind of conductors.