OPTICAL BAND-GAP SHRINKAGE IN HIGHLY TRANSPARENT AND CONDUCTING ZNO THIN-FILMS DEPOSITED BY THE PYROSOL PROCESS

Citation
A. Tiburciosilver et al., OPTICAL BAND-GAP SHRINKAGE IN HIGHLY TRANSPARENT AND CONDUCTING ZNO THIN-FILMS DEPOSITED BY THE PYROSOL PROCESS, Journal of applied physics, 76(3), 1994, pp. 1992-1994
Citations number
13
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
76
Issue
3
Year of publication
1994
Pages
1992 - 1994
Database
ISI
SICI code
0021-8979(1994)76:3<1992:OBSIHT>2.0.ZU;2-X
Abstract
An optical band-gap shrinkage was found in highly transparent and cond ucting thin films deposited by the Pyrosol Process. The narrowing appe ars at carrier concentrations which are consistent with a metal-semico nductor transition. The gap-shrinkage dependence on carrier concentrat ion is consistent with the model proposed by P E. Schmid [Phys. Rev. B 23, 5531 (1981)] for Si:As and Si:B.