X-RAY POWDER DIFFRACTION STUDY OF THE PHASE-TRANSITIONS IN TI4O7

Citation
R. Melzer et Ch. Ruscher, X-RAY POWDER DIFFRACTION STUDY OF THE PHASE-TRANSITIONS IN TI4O7, Phase transitions, 58(4), 1996, pp. 285-295
Citations number
14
Categorie Soggetti
Crystallography,"Physics, Condensed Matter
Journal title
ISSN journal
01411594
Volume
58
Issue
4
Year of publication
1996
Part
A
Pages
285 - 295
Database
ISI
SICI code
0141-1594(1996)58:4<285:XPDSOT>2.0.ZU;2-V
Abstract
A high precision temperature dependent X-ray powder diffraction study has been carried out on Ti4O7 in the temperature range between 180 and 90 K enclosing the metal-insulator and the so-called Ti4O7-Verwey tra nsition. Both transitions are characterized by negative Volume effects as can be deduced from the temperature dependent course of the lattic e parameters. Total strains induced by the formation of the intermedia te phase are about 0.007 and about twice that value in the low tempera ture phase. In successive heating and cooling runs it is observed that the low temperature transition occurs stepwise, possibly related to t he deterioration of the modulated structure.