PROFILES OF THE NORMAL AND INVERTED SEMICONDUCTOR INTERFACES - A ZEEMAN STUDY IN ASYMMETRIC CD1-YZNYTE CDTE/CD1-XMNXTE QUANTUM-WELLS/

Authors
GRIESHABER W CIBERT J GAJ JA DAUBIGNE YM WASIELA A
Citation
W. Grieshaber et al., PROFILES OF THE NORMAL AND INVERTED SEMICONDUCTOR INTERFACES - A ZEEMAN STUDY IN ASYMMETRIC CD1-YZNYTE CDTE/CD1-XMNXTE QUANTUM-WELLS/, Physical review. B, Condensed matter, 50(3), 1994, pp. 2011-2014
Citations number
11
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
50
Issue
3
Year of publication
1994
Pages
2011 - 2014
Database
ISI
SICI code
0163-1829(1994)50:3<2011:POTNAI>2.0.ZU;2-V
Abstract
The normal (Cd1-xMnxTe grown on CdTe) and inverted (CdTe on Cd1-xMnxTe ) interfaces are studied separately using a quantitative model of the Zeeman effect of excitons in asymmetric CdTe quantum wells with a magn etic Cd1-xMnxTe barrier on one side and a nonmagnetic Cd1-yZnyTe barri er on the opposite side. The extrinsic effect (dilution of Mn) is domi nant at the inverted interface, while the normal interface allows a ra ther low upper bound to the intrinsic interface effect (due to missing nearest neighbors). Experimental results agree well with model profil es assuming a complete Cd/Mn exchange during growth between the surfac e layer and the subsurface layer.