ULTRAMICROANALYSIS OF DENTAL PLAQUE FILMS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE

Citation
A. Vonbohlen et al., ULTRAMICROANALYSIS OF DENTAL PLAQUE FILMS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE, Journal of trace elements and electrolytes in health and disease, 8(1), 1994, pp. 37-42
Citations number
11
Categorie Soggetti
Biology
ISSN journal
09312838
Volume
8
Issue
1
Year of publication
1994
Pages
37 - 42
Database
ISI
SICI code
0931-2838(1994)8:1<37:UODPFB>2.0.ZU;2-0
Abstract
Microgram quantities of dental plaque were taken near amalgam fillings , gold crowns and intact teeth. Such extremely small samples can be an alysed by total reflection X-ray fluorescence (TXRF), a fairly new var iant of energy dispersive X-ray fluorescence (EDXRF). More than sixty samples were examined directly without chemical pretreatment. Fifteen elements of interest were detected simultaneously within a wide range of mass fraction and with detection limits of several mg/kg. A signifi cant correlation of the Hg-accumulation in plaque and the amalgam fill ings was established. Near these fillings Hg mass fractions can reach a level of 300 mg/kg. The results for other elements, e.g. Au, are les s significant.