Z-SCAN MEASUREMENT OF CHI(3) USING TOP-HAT BEAMS

Citation
W. Zhao et P. Palffymuhoray, Z-SCAN MEASUREMENT OF CHI(3) USING TOP-HAT BEAMS, Applied physics letters, 65(6), 1994, pp. 673-675
Citations number
6
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
65
Issue
6
Year of publication
1994
Pages
673 - 675
Database
ISI
SICI code
0003-6951(1994)65:6<673:ZMOCUT>2.0.ZU;2-Y
Abstract
Z-scan measurements of third-order optical nonlinearities are usually carried out with Gaussian beams. Good quality Gaussian beams are not r eadily available, however, and to overcome this limitation, we analyze the Z-scan experiment using top-hat beams. A graphical method is deve loped which allows straightforward determination of the nonlinear refr action and absorption coefficients from experimental data. The advanta ge of using top-hat beams is that it allows Z-scan measurements using a wide variety of laser sources, including dye lasers. Chi(3) values o btained using Z-scan measurements with top-hat and Gaussian beams are compared for the liquid crystal 5CB (4-cyano-4'-n-pentybiphenyl).