B. Ba et al., ORIENTATION-DEPENDENT ELECTRONIC-PROPERTIES OF N-TYPE GAAS IN CONTACTWITH VARIOUS REDOX SYSTEMS IN ACETONITRILE AND METHANOL, Semiconductor science and technology, 9(8), 1994, pp. 1529-1534
The flatband potential of n-GaAs/non-aqueous electrolyte contacts has
been measured as a function of (i) the redox energy level of the elect
rolyte (over 2 V in acetonitrile and over 1.3 V in methanol) and (ii)
the crystallographic orientation, considering the [100], [111]As, [111
]Ga and [110] faces. The experimental conditions have been selected to
prevent oxide formation. A strong Fermi level pinning (FLP) is observ
ed for the [100] and both [111] faces due to the same surface state di
stribution for a given solvent. For acetonitrile (methanol), this dist
ribution is localized near one-third of the gap (0.1 eV) from the vale
nce band edge. In comparison with the [100] face, both [111] faces exh
ibit a flatband potential negatively shifted by 0.5-0.7 V. This shift
can be correlated with the piezoelectric property of the [111] directi
on. On the contrary, for the [110] face there is no FLP. The flatband
potential is independent of the redox level when this latter is varied
over all the GaAs gap. This means that the interactions between the r
edox species and the GaAs surface are sufficiently weak to hold the id
eal character of the [110] surface, i.e. without surface states as for
the cleaved surface in UHV conditions.