DETERMINATION OF ULTRATRACE AMOUNTS OF METALLIC AND CHLORIDE-ION IMPURITIES IN ORGANIC MATERIALS FOR MICROELECTRONICS DEVICES AFTER A MICROWAVE DIGESTION METHOD

Citation
M. Takenaka et al., DETERMINATION OF ULTRATRACE AMOUNTS OF METALLIC AND CHLORIDE-ION IMPURITIES IN ORGANIC MATERIALS FOR MICROELECTRONICS DEVICES AFTER A MICROWAVE DIGESTION METHOD, Analyst, 122(2), 1997, pp. 129-132
Citations number
13
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00032654
Volume
122
Issue
2
Year of publication
1997
Pages
129 - 132
Database
ISI
SICI code
0003-2654(1997)122:2<129:DOUAOM>2.0.ZU;2-F
Abstract
A digestion method was developed for the determination of ultratrace c oncentrations of sodium, potassium, magnesium, calcium and chloride io ns, Using ETAAS and ion chromatography, the digestion method was appli ed successfully to the determination of ultratrace concentrations of t hese elements in organic materials for microelectronics devices such a s photoresists, epoxy resins, and liquid crystals, Very low contaminat ion levels were maintained throughout the procedure, The blank levels were 0.05 ng for sodium, 0.02 ng for potassium, 0.03 ng for magnesium and calcium, and 20 ng for chloride ion, The method is very effective in measuring the impurity distributions of organic materials whilst pr eventing their contamination from the surrounding environment and from the reagents used in the procedure.