STRUCTURAL AND ELECTRICAL-PROPERTIES OF RF-SPUTTERED CU TE/CDTE CONTACT/

The Cu/Te/CdTe contact has been investigated using electrical and stru ctural measurements. The contact resistance r(c) exhibits peaks depend ing on the annealing temperatures. These peaks are attributed to succe ssive phase transformations. Structural investigations show that two p hase transformations take place: at low temperature, the diffusivity o f Cu in CdTe is the most important leading to the phase transformation : Cu2-xTe --> Cu7Te5, while at high temperatures, the diffusivity of T e is greater and the reverse phase transformation takes place.