X-RAY-DIFFRACTION OF ALUMINUM NITRIDE AT HEAT-TREATMENT TEMPERATURE BETWEEN 20-DEGREES-C AND 1,200-DEGREES-C

Authors
ANSART F YOKOGAWA Y TRAVERSE JP
Citation
F. Ansart et al., X-RAY-DIFFRACTION OF ALUMINUM NITRIDE AT HEAT-TREATMENT TEMPERATURE BETWEEN 20-DEGREES-C AND 1,200-DEGREES-C, Revue Internationale des Hautes Temperatures et des Refractaires, 29(2), 1994, pp. 49-53
Citations number
12
Categorie Soggetti
Material Science, Ceramics
Journal title
Revue Internationale des Hautes Temperatures et des Refractaires → ACNP
ISSN journal
00353434
Volume
29
Issue
2
Year of publication
1994
Pages
49 - 53
Database
ISI
SICI code
0035-3434(1994)29:2<49:XOANAH>2.0.ZU;2-8
Abstract
This paper concerns the study of the oxidation of the aluminium nitrid e at high temperature by X-ray diffraction. This coating is used in or der to protect based-carbon composite materials against the oxidation. The X-ray diffraction method allows to follow the in-situ behavior of aluminium nitride under several thermal treatment conditions. The exp erimental device is used to follow the structural variations occuring in the samples during the heat treatment. Then, we present the evoluti on of the lattice parameters during the oxidation at high temperature.