DEVELOPMENT OF A MU-LCR FACILITY AT LAMPF

It has long been recognized that muLCR could profitably be done with t he high intensity surface beam at LAMPF [1]. A spectrometer has been b uilt that is matched to the LAMPF beam characteristics. The polarizati on information is obtained from a downstream array of counters while s ide counters, containing no polarization signal, monitor the mu+ beam. Degraders select higher energy e+, thereby reducing rates and require d counter segmentation while maintaining information content. We apply a ramped longitudinal field in addition to the static one to average over instabilities iii the mu+ beam. This field scan allows direct int erpretation of data and does not require a prior estimate of the reson ance structure of a sample. Flux coils monitor the applied ramp field and eddy-current induced fields. High average rate (2 x 10(7) mu+/s), good stability, and the versatile field scan permitted useful data to be collected from Cu, Al(Cu), Al, Si(Al), and polycrystalline Si targe ts.