A study has been made of how defects and stress in the substrate affec
t the uniformity of the formation of porous silicon films during anodi
c etching of a silicon substrate in hydrofluoric acid. In regions of a
n elevated concentration of defects and stress, there is a transition
from a region in which porous silicon is formed to an electropolishing
regime. An energy mechanism is ro sed for a local nucleation of voids
at a silicon surface.