An ex situ process has been developed to produce thin superconducting
Tl2Ba2CaCu2O8 films. The properties of films grown on different substr
ates using different annealing regimes were studied. Critical temperat
ures of 103-107 K were measured on films prepared in a broad range of
annealing temperatures on SrTiO3, LaAlO3, and Y-ZrO2 substrates. A cri
tical current density, J(c), of 2 x 10(6) A/cm2 at 77 K was measured o
n LaAlO3. Film morphology was studied by SEM, AFM, and STM.